doi.org/10.1007/978-3-031-10467-1_33
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Design and Analysis of Pre-formed ReRAM-Based PUF
We present a Resistive Random Access Memory based Physical Unclonable Function design that gives near-ideal characteristics with high reliability when operating in extreme temperature conditions. By injecting the cells with electric currents, the resistances are much...
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Design and Analysis of Pre-formed ReRAM-Based PUF
We present a Resistive Random Access Memory based Physical Unclonable Function design that gives near-ideal characteristics with high reliability when operating in extreme temperature conditions. By injecting the cells with electric currents, the resistances are much...
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https://doi.org/10.1007/978-3-031-10467-1_33Design and Analysis of Pre-formed ReRAM-Based PUF
We present a Resistive Random Access Memory based Physical Unclonable Function design that gives near-ideal characteristics with high reliability when operating in extreme temperature conditions. By injecting the cells with electric currents, the resistances are much...
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